Modeling Atomic-Scale Electrical Contact Quality Across Two-Dimensional Interfaces.
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S. Du | Hongjun Gao | Jianbin Luo | Hongliang Lu | Qunyang Li | Lei Gao | Yanmin Liu | T. Ma | R. Shi | Yuan-zhong Hu | Xin Li | Yuan Ma | Aisheng Song | H. Guo | Jie Zhang | Xiao Liu | Xinjian Tang