Measurement technique for high frequency characterization of semiconducting materials in extruded cables

Knowledge on the dependence of wave propagation characteristics on material properties and cable design is important in establishing diagnostic methods for cable insulation. In this study, a high frequency measurement technique to characterize the semi-conducting screens in medium voltage cross-linked polyethylene (XLPE) cables has been developed. The frequency ranges from 30 kHz to 500 MHz. The influence of the experimental set-up, sample preparation methods, pressure and temperature are investigated. A dielectric function is developed for the semiconducting screens and this is incorporated into a high frequency model for the cable. The propagation characteristics obtained from the high frequency cable model are compared with those obtained from measurements made on the same cables.

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