Impact of Aging on the Reliability of Delay PUFs

Physically Unclonable Functions (PUFs) are mainly used for generating unique keys to identify electronic devices. These entities mainly benefit from the process variations occurring during the device manufacturing. To be able to use PUFs to identify electronic devices or to utilize them in cryptographic applications, the reliability of PUFs needs to be assured under a wide variety of environmental conditions and aging mechanisms, including the switching activity of the PUFs’ internal signals. In practice, it is important to evaluate aging effects as early as possible, preferentially at design time. In this paper, we evaluate the impact of aging on two types of delay-PUFs (arbiter-PUFs and loop-PUFs) with different switching activities. This work takes advantage of both simulation tool and silicon tests on a 65nm ASIC implementation. To expedite the simulation process and get rid of conducting simulations of multiple delay-element PUFs, we propose an extrapolation method to evaluate the effect of BTI (Bias Temperature-Instability) and HCI (Hot Carrier Injection) aging under different switching activities on PUFs with multiple delay elements using the aging effects on single delay-element PUFs. The results show that switching activity (expressed in terms of transitions/time) has a limited impact on delay chains of considered delay-PUFs, while it has a greater impact on the arbiter (RS latch) of the arbiter-PUF. The simulation results show that the aging-related Bit Error Rate in an arbiter-PUF with high switching activity can be 11 times worse than the Bit Error Rate in the same PUF when there is no activity in 20 months.

[1]  S. Mahapatra,et al.  On the generation and recovery of interface traps in MOSFETs subjected to NBTI, FN, and HCI stress , 2006, IEEE Transactions on Electron Devices.

[2]  Chip-Hong Chang,et al.  A Low-Power Hybrid RO PUF With Improved Thermal Stability for Lightweight Applications , 2015, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.

[3]  Daniel E. Holcomb,et al.  Power-Up SRAM State as an Identifying Fingerprint and Source of True Random Numbers , 2009, IEEE Transactions on Computers.

[4]  Mark Mohammad Tehranipoor,et al.  Bit selection algorithm suitable for high-volume production of SRAM-PUF , 2014, 2014 IEEE International Symposium on Hardware-Oriented Security and Trust (HOST).

[5]  Mehdi Baradaran Tahoori,et al.  ExtraTime: Modeling and analysis of wearout due to transistor aging at microarchitecture-level , 2012, IEEE/IFIP International Conference on Dependable Systems and Networks (DSN 2012).

[6]  Michael S. Kirkpatrick,et al.  Techniques to Combat Drift in PUF-based Authentication Systems , 2010 .

[7]  Dieter K. Schroder,et al.  Negative bias temperature instability: What do we understand? , 2007, Microelectron. Reliab..

[8]  Sylvain Guilley,et al.  On the entropy of Physically Unclonable Functions , 2016, 2016 IEEE International Symposium on Information Theory (ISIT).

[9]  Mark Mohammad Tehranipoor,et al.  ARO-PUF: An aging-resistant ring oscillator PUF design , 2014, 2014 Design, Automation & Test in Europe Conference & Exhibition (DATE).

[10]  Srinivas Devadas,et al.  Silicon physical random functions , 2002, CCS '02.

[11]  Patrick Schaumont,et al.  An Analysis of Delay Based PUF Implementations on FPGA , 2010, ARC.

[12]  Josep Torrellas,et al.  Facelift: Hiding and slowing down aging in multicores , 2008, 2008 41st IEEE/ACM International Symposium on Microarchitecture.

[13]  Chang-Chih Chen,et al.  Extraction of threshold voltage degradation modeling due to Negative Bias Temperature Instability in circuits with I/O measurements , 2014, 2014 IEEE 32nd VLSI Test Symposium (VTS).

[14]  Mark Mohammad Tehranipoor,et al.  An Aging-Resistant RO-PUF for Reliable Key Generation , 2016, IEEE Transactions on Emerging Topics in Computing.

[15]  G. Edward Suh,et al.  Physical Unclonable Functions for Device Authentication and Secret Key Generation , 2007, 2007 44th ACM/IEEE Design Automation Conference.

[16]  Sylvain Guilley,et al.  An Easy-to-Design PUF Based on a Single Oscillator: The Loop PUF , 2012, 2012 15th Euromicro Conference on Digital System Design.

[17]  Akashi Satoh,et al.  Quantitative and Statistical Performance Evaluation of Arbiter Physical Unclonable Functions on FPGAs , 2010, 2010 International Conference on Reconfigurable Computing and FPGAs.

[18]  Abhranil Maiti,et al.  The Impact of Aging on a Physical Unclonable Function , 2014, IEEE Transactions on Very Large Scale Integration (VLSI) Systems.

[19]  R. Rodriguez,et al.  Modeling and experimental verification of the effect of gate oxide breakdown on CMOS inverters , 2003, 2003 IEEE International Reliability Physics Symposium Proceedings, 2003. 41st Annual..

[20]  Roel Maes,et al.  Countering the effects of silicon aging on SRAM PUFs , 2014, 2014 IEEE International Symposium on Hardware-Oriented Security and Trust (HOST).

[21]  Yu Cao,et al.  The Impact of NBTI Effect on Combinational Circuit: Modeling, Simulation, and Analysis , 2010, IEEE Transactions on Very Large Scale Integration (VLSI) Systems.

[22]  H. Kufluoglu,et al.  A Generalized Reaction–Diffusion Model With Explicit H– $\hbox{H}_{2}$ Dynamics for Negative-Bias Temperature-Instability (NBTI) Degradation , 2007, IEEE Transactions on Electron Devices.

[23]  M.J.M. Pelgrom,et al.  Matching properties of MOS transistors , 1989 .

[24]  D. Varghese,et al.  A comprehensive model for PMOS NBTI degradation: Recent progress , 2007, Microelectron. Reliab..

[25]  C. Cabral,et al.  A Comparative Study of NBTI and PBTI (Charge Trapping) in SiO2/HfO2 Stacks with FUSI, TiN, Re Gates , 2006, 2006 Symposium on VLSI Technology, 2006. Digest of Technical Papers..

[26]  Guido Groeseneken,et al.  Positive Bias Temperature Instability in nMOSFETs with ultra-thin Hf-silicate gate dielectrics , 2005 .

[27]  Sylvain Guilley,et al.  Predictive Aging of Reliability of Two Delay PUFs , 2016, SPACE.

[28]  Ken Mai,et al.  An efficient reliable PUF-based cryptographic key generator in 65nm CMOS , 2014, 2014 Design, Automation & Test in Europe Conference & Exhibition (DATE).

[29]  Jie Ding,et al.  Modelling RTN and BTI in nanoscale MOSFETs from device to circuit: A review , 2014, Microelectronics and reliability.

[30]  Sylvain Guilley,et al.  Impact of Aging on Template Attacks , 2018, ACM Great Lakes Symposium on VLSI.

[31]  Jyothi Velamala,et al.  Compact Modeling of BTI for Circuit Reliability Analysis , 2015 .

[32]  Jorge Guajardo,et al.  FPGA Intrinsic PUFs and Their Use for IP Protection , 2007, CHES.

[33]  Fan Yang,et al.  Statistical reliability analysis under process variation and aging effects , 2009, 2009 46th ACM/IEEE Design Automation Conference.

[34]  Mark Mohammad Tehranipoor,et al.  Test-Pattern Grading and Pattern Selection for Small-Delay Defects , 2008, 26th IEEE VLSI Test Symposium (vts 2008).

[35]  Derek Chiou,et al.  Efficient fault-tolerance for pipelined structures and its application to superscalar and dataflow machines , 2008 .

[36]  Jean-Luc Danger,et al.  Evaluation of Delays PUFs on CMOS 65 nm Technology: ASIC vs FPGA , 2013 .

[37]  Sylvain Guilley,et al.  Impact of the switching activity on the aging of delay-PUFs , 2017, 2017 22nd IEEE European Test Symposium (ETS).

[38]  Mark Zwolinski,et al.  NBTI aging evaluation of PUF-based differential architectures , 2016, 2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS).

[39]  Mark Mohammad Tehranipoor,et al.  Advanced Analysis of Cell Stability for Reliable SRAM PUFs , 2014, 2014 IEEE 23rd Asian Test Symposium.

[40]  Sylvain Guilley,et al.  On the Effect of Aging in Detecting Hardware Trojan Horses with Template Analysis , 2018, 2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS).

[41]  P. Nicollian,et al.  Material dependence of hydrogen diffusion: implications for NBTI degradation , 2005, IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest..

[42]  Chu Tsui Ping,et al.  Studies of the critical LDD area for HCI improvement , 2008, 2008 IEEE International Conference on Semiconductor Electronics.

[43]  Paulo F. Butzen,et al.  BTI, HCI and TDDB aging impact in flip-flops , 2013, Microelectron. Reliab..

[44]  Elaine B. Barker,et al.  A Statistical Test Suite for Random and Pseudorandom Number Generators for Cryptographic Applications , 2000 .

[45]  Kyung Ki Kim.  On-Chip Delay Degradation Measurement for Aging Compensation , 2015 .