Characterization of Oxygen Accumulation in Indium-Tin-Oxide for Resistance Random Access Memory
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Jung-Hui Chen | Simon M. Sze | Kuan-Chang Chang | Min-Chen Chen | Tsung-Ming Tsai | Jen-Chung Lou | Kai-Huang Chen | Tai-Fa Young | Wen-Jen Chen | S. Sze | Kuan‐Chang Chang | Ting‐Chang Chang | T. Tsai | Min-Chen Chen | Kai-Huang Chen | Yong-En Syu | Wen-Jen Chen | Jung-hui Chen | J. Lou | Ting-Chang Chang | Hsin-Lu Chen | Shu-Ping Liang | Yong-En Syu | T. Young | Rui Zhang | Syuan-Yong Huang | S. Huang | R. Zhang | Hsin-Lu Chen | Shu-Ping Liang | T. Chang
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