Identification and Cost Estimation of WIP Bubbles in a Fab

We quantify the impact of work in process (WIP) bubbles on a semiconductor fab. As a preliminary step, we formalize the concept of WIP bubbles by decomposing them into local events of relatively acute and temporary WIP congestion. The local bubble is empirically identified and its impact on local waiting time distribution is assessed. We then estimate its marginal impact on the overall line waiting time and cost. Finally, a novel visualization tool for the bubble's progression is proposed.

[1]  Shekar Krishnaswamy,et al.  Implementing the theory of constraints philosophy in highly reentrant systems , 1998, 1998 Winter Simulation Conference. Proceedings (Cat. No.98CH36274).

[2]  C. Cunningham,et al.  A80-a new perspective on predictable factory performance , 1998, IEEE/SEMI 1998 IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop (Cat. No.98CH36168).

[3]  Amit K. Gupta,et al.  ASAP applications of simulation modeling in a wafer fab , 2002, Proceedings of the Winter Simulation Conference.

[4]  Sunil Kumar,et al.  Queueing network models in the design and analysis of semiconductor wafer fabs , 2001, IEEE Trans. Robotics Autom..

[5]  Shang Zhi,et al.  A proof of the queueing formula: L=λW , 2001 .

[6]  Robert C. Leachman,et al.  Special Issue: Franz Edelman Award for Achievement in Operations Research and the Management Sciences: SLIM: Short Cycle Time and Low Inventory in Manufacturing at Samsung Electronics , 2002, Interfaces.

[7]  Reha Uzsoy,et al.  Quantifying the benefits of cycle time reduction in semiconductor wafer fabrication , 2000 .

[8]  U. Arazy,et al.  A framework model for fab agility and 25 ways to be agile , 2000, Proceedings of ISSM2000. Ninth International Symposium on Semiconductor Manufacturing (IEEE Cat. No.00CH37130).

[9]  John W. Fowler,et al.  A new scheduling approach using combined dispatching criteria in wafer fabs , 2003 .

[10]  P. R. Kumar,et al.  Distributed scheduling based on due dates and buffer priorities , 1991 .

[11]  P. M. Pelagagge,et al.  Performance analysis of automated interbay material handling and storage systems for large wafer fab , 1994, Proceedings of 16th IEEE/CPMT International Electronic Manufacturing Technology Symposium.

[12]  Douglas C. Montgomery,et al.  Introduction to Statistical Quality Control , 1986 .

[13]  P. McGlynn,et al.  How to get predictable throughput times in a multiple product environment , 1997, 1997 IEEE International Symposium on Semiconductor Manufacturing Conference Proceedings (Cat. No.97CH36023).

[14]  R. C. Leachman,et al.  Stochastic wafer fabrication scheduling , 2003 .

[15]  S. Bilgin,et al.  Implementation of a WIP modeling system at LSI logic , 2003 .

[16]  Gerald T. Mackulak,et al.  A simulation-based cost modeling methodology for evaluation of interbay material handling in a semiconductor wafer fab , 2000, 2000 Winter Simulation Conference Proceedings (Cat. No.00CH37165).

[17]  Pacifico M. Pelagagge,et al.  Performance analysis of automated interbay material-handling and storage systems for large Wafer Fab , 1996 .

[18]  J. Little A Proof for the Queuing Formula: L = λW , 1961 .

[19]  N.S. Grewal,et al.  Validating simulation model cycle times at Seagate Technology , 1999, WSC'99. 1999 Winter Simulation Conference Proceedings. 'Simulation - A Bridge to the Future' (Cat. No.99CH37038).

[20]  J. Shanthikumar,et al.  Empirical results on the relationship between die yield and cycle time in semiconductor wafer fabrication , 1996 .

[21]  T. Baker,et al.  Comprehensive cycle time reduction program at AMD's fab25 , 2001, 2001 IEEE International Symposium on Semiconductor Manufacturing. ISSM 2001. Conference Proceedings (Cat. No.01CH37203).

[22]  Roger M. Sauter,et al.  Introduction to Statistical Quality Control (2nd ed.) , 1992 .

[23]  Frank Chance,et al.  WAFER FAB CYCLE TIME MANAGEMENT USING MES DATA , 2000 .

[24]  Oliver Rose WIP evolution of a semiconductor factory after a bottleneck workcenter breakdown , 1998, 1998 Winter Simulation Conference. Proceedings (Cat. No.98CH36274).