Extended Abstract of "Spectrum-Based Fault Localization in Software Product Lines"

Testing Software Product Lines (SPLs) is a challenging approach due to the huge number of products under test. Most of the SPL testing approaches have proposed novel ideas to make verification and validation activities cost-effective. However, after executing tests and detecting faults, debugging is a cumbersome and time consuming task. In our article [1], we proposed a debugging approach to localize bugs in SPLs that works in two steps: first, feature sets of the SPL are ranked according to their suspiciousness (i.e., likelihood of being faulty) by applying spectrum-based fault localization techniques. In a second step, a fault isolation algorithm is used to generate valid products of minimum size containing the most suspicious features, helping to isolate the cause of failures.