论文信息 - Efficient electromigration testing with a single current source

Efficient electromigration testing with a single current source

This article introduces a simple and effective technique for conducting electromigration testing of a number of samples using a single current source. It is based on a configuration where all samples are serially connected to a single current source, allowing them to be subjected to identical current conditions. In this design, each sample has a current bypass circuit, consisting essentially of a computer controlled shunt relay and a Zener diode, to enable continuation of testing without any interruption in the test current when samples fail. With this technique, a large number of samples can be tested with the same current and excellent current stability, making it suitable for both reliability assessment and scientific investigation of electromigration mechanisms. Initial results show high correlation with industry standard testing systems.

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