Conductor loss on transmission lines in monolithic microwave and millimeter-wave integrated circuits

A field-theoretical analysis of conductor loss on planar transmission lines is presented. The full-wave approach employed holds for arbitrary values of metallization thickness and skin depth. Its validity is checked by comparison to measurement data on coplanar waveguide (CPW). The results are discussed and compared with modeling approaches available so far. The considerations concentrate on the CPW case where, in contrast to the microstrip structures used in hybrid ICs, a significant influence of the fields inside the lossy conductors can be detected. Finally, conclusions regarding both millimeter-wave integrated circuit design and modeling are drawn. © 1992 John Wiley & Sons, Inc.

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