Application of computer-based thermography to thermal measurements of integrated circuits and power devices

Abstract This paper presents the possibilities and the main problems of thermography in VLSI circuits and power devices design and measurement. It is focused on emissivity correction, noise and other measuring difficulties. Advanced new methods of surveys with the use of thermography are also presented. Combining infrared and video images gives the additional possibility of thermography applications. A new method of scan shortening allows the use of infrared cameras for the purpose of investigating short transient thermal states. The applications of image processing algorithms like filtering and averaging in computer-controlled thermography systems are also discussed.