Chip Specific embodiments of a test mode to a memory module

Test mode for component-specific testing a memory module. Data is written into each memory component of a memory module and stored, wherein the data indicates whether the memory component is to run a particular test mode. Upon receipt of a co-fed to all the memory components of the memory module test mode command, each memory component examines the data to determine whether to execute a simultaneously therewith, fed to the test mode command, or supplied subsequently test mode commands.