Parametric yield optimization for MOS circuit blocks

Two techniques are presented for optimizing the parametric yield of digital MOS circuit blocks for VLSI designs. The first is based on quasi-Newton methods and utilizes the gradient of the yield. A novel technique for computing this yield gradient is derived and algorithms for its implementation are discussed. Geometrical considerations motivate the second method which formulates the problem in terms of a minimax problem. Both yield optimization techniques utilize transient sensitivity information from circuit simulations. Encouraging results have been obtained thus far; several circuit examples are included to demonstrate these techniques. >

[1]  J. Bandler,et al.  Yield optimization for arbitrary statistical distributions: Part II-Implementation , 1980 .

[2]  A.L. Sangiovanni-Vincentelli,et al.  A survey of optimization techniques for integrated-circuit design , 1981, Proceedings of the IEEE.

[3]  Ping Yang,et al.  An Integrated and Efficient Approach for MOS VLSI Statistical Circuit Design , 1986, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.

[4]  J. Bandler,et al.  Yield optimization for arbitrary statistical distributions: Part I-Theory , 1980 .

[5]  K. Antreich,et al.  Design centering by yield prediction , 1982 .

[6]  K. Singhal,et al.  Statistical design centering and tolerancing using parametric sampling , 1981 .

[7]  K. S. Tahim,et al.  A radial exploration approach to manufacturing yield estimation and design centering , 1979 .

[8]  Stephen W. Director,et al.  A Design Centering Algorithm for Nonconvex Regions of Acceptability , 1982, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.

[9]  S.S. Mahant-Shetti,et al.  Statistical Modeling for Efficient Parametric Yield Estimation of MOS VLSI Circuits , 1985, IEEE Journal of Solid-State Circuits.

[10]  John W. Bandler,et al.  A nonlinear programming approach to optimal design centering, tolerancing, and tuning , 1976 .

[11]  Robert K. Brayton,et al.  A new algorithm for statistical circuit design based on quasi-newton methods and function splitting , 1979 .

[12]  K. Madsen,et al.  Automated minimax design of networks , 1975 .

[13]  Ping Yang,et al.  SPICE Modeling for Small Geometry MOSFET Circuits , 1982, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.

[14]  P. Chatterjee,et al.  Statistical modelling of small geometry MOSFETs , 1982, 1982 International Electron Devices Meeting.

[15]  K. Madsen,et al.  Algorithms for worst-case tolerance optimization , 1979 .

[16]  G. Hachtel.  The simplicial approximation approach to design centering , 1977 .

[17]  Lars Taxén,et al.  Stochastic optimization in system design , 1981 .

[18]  R. Brayton,et al.  Yield maximization and worst-case design with arbitrary statistical distributions , 1980 .

[19]  M. Lightner.  Multiple criterion optimization with yield maximization , 1981 .

[20]  Stephen W. Director,et al.  Statistical circuit design : a somewhat biased survey , 1981 .

[21]  K. Madsen.  An Algorithm for Minimax Solution of Overdetermined Systems of Non-linear Equations , 1975 .

[22]  J. Bandler,et al.  Optimal centering, tolerancing, and yield determination via updated approximations and cuts , 1978 .