Design of Voltage-Controlled Oscillator with Single-Event Transients Tolerance

Voltage controlled oscillators (VCOs) have been shown to be a critical block of single-event transient (SET) response in mixed-signal circuits used for satellite communication such as the phase-locked loop (PLL). After analyzing the mechanism of frequency to be drifted, a novel structure of VCO consisting of SET hardened bias generator and two cross coupled ring oscillator (RO) cell was designed. This VCO was designed in 130-nm process which had been proposed to minimize the drift of the frequency caused by SET pulse, thus to improve the stability of circuit. Spice based simulation was utilized to demonstrate the improvement of proposed structure. The result showed that the present VCO had a significant improvement by comparing with conventional differential VCO in reducing the control voltage and oscillating frequency drift. During the iron implantation, the PLL with proposed VCO will remain locked and its frequency drift was reduced by 95.58%.

[1]  T. D. Loveless,et al.  A Hardened-by-Design Technique for RF Digital Phase-Locked Loops , 2006, IEEE Transactions on Nuclear Science.

[2]  L. W. Massengill,et al.  Three-dimensional mapping of single-event effects using two photon absorption , 2003 .

[3]  D. S. Walsh,et al.  Comparison of SETs in bipolar linear circuits generated with an ion microbeam, laser light, and circuit simulation , 2002 .

[4]  L. Massengill,et al.  Towards SET Mitigation in RF Digital PLLs: From Error Characterization to Radiation Hardening Considerations , 2005, IEEE Transactions on Nuclear Science.

[5]  Chen Shuming,et al.  Impact of Circuit Placement on Single Event Transients in 65 nm Bulk CMOS Technology , 2012, IEEE Transactions on Nuclear Science.

[6]  Hervé Lapuyade,et al.  Validation of radiation hardened designs by pulsed laser testing and SPICE analysis , 1999 .

[7]  P. C. Adell,et al.  Analysis of single-event transients in analog circuits , 2000 .

[8]  A. B. Campbell,et al.  Pulsed laser-induced SEU in integrated circuits: a practical method for hardness assurance testing , 1990 .

[9]  Stephen LaLumondiere,et al.  Observation of single event upsets in analog microcircuits , 1993 .

[10]  peixiong zhao,et al.  Critical charge for single-event transients (SETs) in bipolar linear circuits , 2001 .

[11]  L. D. Edmonds,et al.  A model for single-event transients in comparators , 2000 .

[12]  C. Poivey,et al.  Characterization of SET response of the LM124A the LM111, and the LM6144 , 2003, 2003 IEEE Radiation Effects Data Workshop.

[13]  T. D. Loveless,et al.  A Single-Event-Hardened Phase-Locked Loop Fabricated in 130 nm CMOS , 2007, IEEE Transactions on Nuclear Science.