论文信息 - Current-Induced Critical State in NbN Thin-Film Structures

Current-Induced Critical State in NbN Thin-Film Structures

Abstract The temperature dependence of the critical current of NbN thin-film bridges was experimentally studied. At low temperatures we observed significant enhancement (up to two times at 4 K) of the critical current density over de-pinning value in the sub-micrometer wide bridges. This enhancement can be described by an increase of the edge barrier for penetration of magnetic vortices into narrow superconducting strips.

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