A GaAs 1K static RAM using tungsten-silicide gate self alignment technology
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H. Ishikawa | T. Shinoki | A. Shibatomi | N. Yokoyama | N. Yokoyama | H. Ishikawa | T. Ohnishi | H. Onodera | T. Ohnishi | A. Shibatomi | H. Onodera | T. Shinoki
[1] Ti/W silicide gate technology for self-aligned GaAs MESFET VLSIS , 1981, 1981 International Electron Devices Meeting.
[2] H. Ishikawa,et al. A self-aligned source/drain planar device for ultrahigh-speed GaAs MESFET VLSIs , 1981, 1981 IEEE International Solid-State Circuits Conference. Digest of Technical Papers.