Effects of ageing on the conducted immunity of a voltage reference: Experimental study and modelling approach

Abstract In this paper, we develop a conducted immunity model based on ICIM-CI approach (Integrated Circuit Immunity Model Conducted Immunity) that takes into account the effect of ageing in the immunity characteristics of a bandgap voltage reference. The modelling approach is briefly described. Then the measurement setup and the ageing procedure are detailed. Finally, the model is established and validated thanks to measurements before and after ageing. This model allows to anticipate the long term electromagnetic compliance of the circuit.

[1]  Alexandre Boyer,et al.  Characterization of Changes in LDO Susceptibility After Electrical Stress , 2013, IEEE Transactions on Electromagnetic Compatibility.

[2]  Franco Fiori.  Operational amplifier input stage robust to EMI , 2001 .

[3]  Alexandre Boyer,et al.  Prediction of aging impact on electromagnetic susceptibility of an operational amplifier , 2015, 2015 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC).

[4]  N. Speciale,et al.  Criteria to reduce failures induced by EMI conducted on the power supply rails of CMOS operational amplifiers , 2001, 2001 IEEE EMC International Symposium. Symposium Record. International Symposium on Electromagnetic Compatibility (Cat. No.01CH37161).

[5]  T.H. Hubing,et al.  The Electromagnetic Compatibility of Integrated Circuits—Past, Present, and Future , 2009, IEEE Transactions on Electromagnetic Compatibility.

[6]  Jean-Michel Redoute,et al.  Design of a folded cascode opamp with increased immunity to conducted electromagnetic interference in 0.18 μm CMOS , 2015, Microelectron. Reliab..

[7]  Frederic Lafon,et al.  Influence of Aging and Environnement Conditions on EMC Performances of Electronic Equipment - Influence of Passive vs Active Components , 2010 .

[8]  Ignacio Gil Galí,et al.  Impact of temperature on the electromagnetic susceptibility of operational amplifiers , 2012 .

[9]  E. Sicard,et al.  Towards an EMC roadmap for Integrated Circuits , 2008, 2008 Asia-Pacific Symposium on Electromagnetic Compatibility and 19th International Zurich Symposium on Electromagnetic Compatibility.

[10]  A. Boyer,et al.  Construction of an Integrated Circuit Emission Model of a FPGA , 2016, 2016 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC).

[11]  Alexandre Boyer,et al.  A methodologic project to characterize and model COTS components EMC behavior after ageing , 2016, 2016 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC).

[12]  G. Duchamp,et al.  Multiport ICIM-CI modeling approach applied to a bandgap voltage reference , 2016, 2016 International Symposium on Electromagnetic Compatibility - EMC EUROPE.

[13]  Hélène Frémont,et al.  Characterization and model of temperature effect on the conducted immunity of Op-Amp , 2015, Microelectron. Reliab..