论文信息 - Two-dimensional defect mapping of the SiO2/4H−SiC interface - 字舞流文

Two-dimensional defect mapping of the SiO2/4H−SiC interface

G. Ferro | D. Dutta | Yasuo Cho | B. Johnson | C. Bongiorno | T. Jung | H. Sigg | U. Grossner | M. Camarda | K. Yamasue | J. Woerle