A 576 K 3.5-ns access BiCMOS ECL static RAM with array built-in self-test
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G. M. Lattimore | W. T. Holman | K. Nguyen | Roy Childs Flaker | D. Lavalette | Henry A. Bonges | Robert Dean Adams | A. J. Allen | Kenneth S. Gray | Erik L. Hedberg | Alan L. Roberts
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