X-Ray Fluorescence Analysis

X-ray fluorescence analysis has come a long way in the sixty years since Moseley began his classic experiments on the relation of x-ray wavelength to atomic number.(1) During this period several significant milestones were reached: in 1923 Coster and Von Hevesy confirmed the existence of element 72, Hafnium, from the x-ray spectra of Norwegian zircon;(2) in the 1930’s concentrations of a fraction of a percent could be measured; in the mid-1940’s the availability of high-powered sealed x-ray tubes, large single crystals, and geiger counters enabled Friedman and Birks to demonstrate a practical system for chemical analysis.(3) in the last twenty years, the technique has developed to a high degree of sophistication and is presently accepted as one of the most useful rapid and economical analytical methods available. The method is simple and straightforward with commercial equipment and a high vacuum is not required.

[1]  E. Gilberg DasK-Röntgenemissionsspektrum des Chlors in freien Molekülen , 1970 .

[2]  E. J. Brooks,et al.  Compton Scattering Interference in Fluorescent X-Ray Spectroscopy , 1957 .

[3]  Eugene P. Bertin,et al.  Principles and Practice of X-Ray Spectrometric Analysis , 1970 .

[4]  J. E. Holliday Soft X-Ray Emission Spectroscopy in the 13- to 44-Å Region , 1962 .

[5]  J. L. Johnson,et al.  The X-Ray Emission Analysis of Thin Films Produced by Lubricating Oil Additives , 1963 .

[6]  B. Cullity,et al.  Elements of X-ray diffraction , 1957 .

[7]  N. Fujino,et al.  Theoretical Formulas for Film Thickness Measurement by Means of Fluorescence X-Rays , 1968 .

[8]  H. Liebhafsky,et al.  Film Thickness by X-Ray Emission Spectrography , 1956 .

[9]  D. W. Fischer,et al.  X-Ray Band Spectra and Molecular-Orbital Structure of Rutile TiO 2 , 1972 .

[10]  J. V. Gilfrich,et al.  Spectral distribution of x-ray tubes for quantitative x-ray fluorescence analysis , 1968 .

[11]  L. S. Birks,et al.  Calculation methods for fluorescent x-ray spectrometry. Empirical coefficients versus fundamental parameters , 1968 .

[12]  G. Hevesy,et al.  On the Missing Element of Atomic Number 72 , 1923, Nature.

[13]  H. Liebhafsky,et al.  Book Reviews: X-Ray Absorption and Emission in Analytical Chemistry , 1961 .

[14]  J. M. Francis,et al.  The application of thin layer x-ray fluorescence analysis to oxide composition studies on stainless steels , 1968 .

[15]  R. Manne Molecular Orbital Interpretation of X‐Ray Emission Spectra: Simple Hydrocarbons and Carbon Oxides , 1970 .

[16]  P. K. Koh,et al.  Metallurgical Applications of X‐Ray Fluorescent Analysis , 1952 .

[17]  A. H. Compton,et al.  X-rays in Theory and Experiment , 1935 .

[18]  H. Moseley,et al.  XCIII. The high-frequency spectra of the elements , 1913 .

[19]  L. S. Birks,et al.  A Geiger counter spectrometer for X-ray fluorescence analysis. , 1948, The Review of scientific instruments.

[20]  S. G. Thompson,et al.  Application of High-Resolution Semiconductor Detectors in X-ray Emission Spectrography , 1966, Science.

[21]  E. White,et al.  Silicon valence in SiO films studied by X-ray emission , 1964 .

[22]  L. S. Birks,et al.  Energy Dispersion for Quantitative X-Ray Spectrochemical Analysis. , 1966 .

[23]  T. Rhodin Chemical Analysis of Thin Films by X-Ray Emission Spectrography , 1955 .

[24]  B. L. Henke,et al.  X-Ray Fluorescence Analysis for Sodium, Fluorine, Oxygen, Nitrogen, Carbon, and Boron* , 1963 .

[25]  G. V. Gibbs,et al.  Structural and chemical effects on the A1 Kβ X-ray emission band among aluminum containing silicates and aluminum oxides , 1969 .

[26]  H. A. Liebhafsky,et al.  Practical X-ray spectrometry , 1969 .