论文信息 - A Low-High Temperature Camera for In-Situ X-Ray Diffraction Studies of Catalysts - 字舞流文

A Low-High Temperature Camera for In-Situ X-Ray Diffraction Studies of Catalysts

J. Cohen | J. Pielaszek

[1] R. K. Nandi,et al. Pt/SiO2: VI. The effects of pretreatment on structures , 1982 .

[2] R. K. Nandi,et al. PdSiO2: I. In situ X-ray diffraction studies during treatment and hydrogenolysis , 1981 .

[3] A. Borodziński,et al. Flow reactor for kinetic studies with simultaneous X-ray phase analysis of a catalyst , 1977 .

[4] M. Milberg. Transparency Factor for Weakly Absorbing Samples in X‐Ray Diffractometry , 1958 .