Understanding device performance by incorporating 2D-carrier profiles from high resolution scanning spreading resistance microscopy into device simulations
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Geert Hellings | Trudo Clarysse | Wilfried Vandervorst | Kristin De Meyer | Andreas Schulze | Pierre Eyben | Aftab Nazir | Jay Mody | K. De Meyer | G. Hellings | W. Vandervorst | J. Mody | P. Eyben | A. Schulze | T. Clarysse | A. Nazir
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