Neutron-induced 10B fission as a major source of soft errors in high density SRAMs

Abstract The impact of cosmic neutron induced 10 B fission in production submicron SRAM devices is reported for the first time. Using a cold neutron beam to accelerate soft error rate events, we unambiguously demonstrate that neutron induced 10 B fission can be a significant source of soft errors in deep-submicron SRAMs fabricated with borophosphosilicate glass.

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