Characterization and manipulation of individual defects in insulating hexagonal boron nitride using scanning tunnelling microscopy.
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Kenji Watanabe | T. Taniguchi | A. Zettl | M. Crommie | Feng Wang | L. Ju | J. Velasco | S. Kahn | H. Tsai | Dillon Wong | Juwon Lee | Chad Germany | Kenji Watanabe