WSIM: A Symbolic Waveform Simulator
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[1] Gordon L. Smith,et al. Model for Delay Faults Based upon Paths , 1985, ITC.
[2] Sudhakar M. Reddy,et al. On the computation of the ranges of detected delay fault sizes , 1989, 1989 IEEE International Conference on Computer-Aided Design. Digest of Technical Papers.
[3] Edward J. McCluskey,et al. Three-pattern tests for delay faults , 1994, Proceedings of IEEE VLSI Test Symposium.
[4] Robert B. Hitchcock,et al. Timing Analysis of Computer Hardware , 1982, IBM J. Res. Dev..
[5] John J. Shedletsky,et al. An Experimental Delay Test Generator for LSI Logic , 1980, IEEE Transactions on Computers.
[6] P. Jain,et al. Some techniques for efficient symbolic simulation-based verification , 1992, Proceedings 1992 IEEE International Conference on Computer Design: VLSI in Computers & Processors.
[7] Edward B. Eichelberger,et al. Hazard Detection in Combinational and Sequential Switching Circuits , 1964, IBM J. Res. Dev..
[8] Gaetano Borriello,et al. An approach to symbolic timing verification , 1992, [1992] Proceedings 29th ACM/IEEE Design Automation Conference.
[9] Edward J. McCluskey,et al. DELAY TESTING OF DIGITAL CIRCUITS BY OUTPUT WAVEFORM ANALYSIS , 1991, 1991, Proceedings. International Test Conference.
[10] Eric Lindbloom,et al. Transition Fault Simulation , 1987, IEEE Design & Test of Computers.
[11] Allan L. Fisher,et al. Verifying pipelined hardware using symbolic logic simulation , 1989, Proceedings 1989 IEEE International Conference on Computer Design: VLSI in Computers and Processors.
[12] Nagisa Ishiura,et al. Coded time-symbolic simulation using shared binary decision diagram , 1991, DAC '90.
[13] Randal E. Bryant,et al. Symbolic simulation—techniques and applications , 1990, DAC '90.
[14] Nagisa Ishiura,et al. Time-Symbolic Simulation for Accurate Timing Verification of Asynchronous Behavior of Logic Circuits , 1989, 26th ACM/IEEE Design Automation Conference.
[15] Serge Pravossoudovitch,et al. Delay-fault diagnosis based on critical path tracing from symbolic simulation , 1992, [Proceedings] 1992 IEEE International Symposium on Circuits and Systems.
[16] Randal E. Bryant,et al. Test Pattern Generation for Sequential MOS Circuits by Symbolic Fault Simulation , 1989, 26th ACM/IEEE Design Automation Conference.