论文信息 - Influence of the thickness of the tunnel layer on the charging characteristics of Si nanocrystals embedded in an ultra-thin SiO2 layer - 字舞流文

Influence of the thickness of the tunnel layer on the charging characteristics of Si nanocrystals embedded in an ultra-thin SiO2 layer

A. Claverie | M. Carrada | A. Arbouet | V. Paillard | S. Schamm | G. Benassayag | C. Bonafos | J. Grisolia | M. Shalchian | C. Dumas