TEM observations on grain boundaries in sintered silicon, part 1
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[1] C. B. Carter,et al. Direct TEM determination of intrinsic and extrinsic stacking fault energies of silicon , 1979 .
[2] C. B. Carter,et al. Diffraction effects and images from inclined grain boundaries in polycrystalline thin foils , 1979 .
[3] A. Bourret,et al. The low-angle [011] tilt boundary in germanium I. High-resolution structure determination , 1979 .
[4] F. Schapink,et al. Dislocation Networks in Twin Boundaries , 1978, April 16.
[5] S. Isoda,et al. Lattice imaging of a grain boundary in crystalline germanium , 1977 .
[6] P. Haasen,et al. Constrictions in the stacking faults of dislocations in germanium , 1977 .
[7] A. Renault,et al. Multi-beam lattice images from germanium oriented in (011) , 1977 .
[8] G. Chadwick,et al. Grain boundary structure and properties , 1976 .
[9] T. Tan,et al. The detection of the periodic structure of high-angle twist boundaries , 1975 .
[10] T. Page,et al. The Structure of Grain Boundaries. A Model Based on Planar Watching , 1973 .
[11] Y. Komem,et al. Electron microscope studies of grain boundary dislocation behavior , 1972 .
[12] P. Pumphrey. A plane matching theory of high angle grain boundary structure , 1972 .
[13] R. Balluffi,et al. Extraneous grain boundary dislocations in low and high angle (001) twist boundaries in gold , 1971 .
[14] D. Cockayne,et al. A study of the relationship between lattice fringes and lattice planes in electron microscope images of crystals containing defects , 1971 .
[15] Herbert F. Mataré,et al. Defect electronics in semiconductors , 1971 .
[16] W. Bollmann. Crystal Defects and Crystalline Interfaces , 1970 .
[17] T. Schober,et al. Quantitative observation of misfit dislocation arrays in low and high angle twist grain boundaries , 1970 .
[18] M. Whelan,et al. Investigations of dislocation strain fields using weak beams , 1969 .
[19] P. Haasen,et al. Dislocations and Plastic Flow in the Diamond Structure , 1969 .