Techniques for Minimizing the Basal Plane Dislocation Density in SiC Epilayers to Reduce Vf Drift in SiC Bipolar Power Devices
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John W. Palmour | H. Lendenmann | Marek Skowronski | Christer Hallin | Mrinal K. Das | Peder Bergman | Michael J. O'Loughlin | Erik Janzén | E. Janzén | B. Hull | M. Das | J. Palmour | J. Sumakeris | M. Paisley | M. O'loughlin | S. Ha | M. Skowronski | H. Lendenmann | C. Hallin | Michael J. Paisley | Calvin H. Carter Jr. | P. Bergman | Joseph J. Sumakeris | Brett A. Hull | Seo Young Ha | E. Janzén
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