Effect of Zn on the intermetallics formation and reliability of Sn-3.5Ag solder on a Cu pad
暂无分享,去创建一个
[1] F. Che,et al. Performance assessment on board-level drop reliability for chip scale packages (fine-pitch BGA) , 2006, 56th Electronic Components and Technology Conference 2006.
[2] Sung K. Kang,et al. Spalling of intermetallic compounds during the reaction between lead-free solders and electroless Ni-P metallization , 2004 .
[3] Kwang-Lung Lin,et al. Early stage soldering reaction and interfacial microstructure formed between molten Sn-Zn-Ag solder and Cu substrate , 2005 .
[4] B. Moran,et al. Creep, stress relaxation, and plastic deformation in Sn-Ag and Sn-Zn eutectic solders , 1997 .
[5] Jin Yu,et al. Correlation between chemical reaction and brittle fracture found in electroless Ni(P)/immersion gold–solder interconnection , 2005 .
[6] Da-Yuan Shih,et al. Microstructure and mechanical properties of lead-free solders and solder joints used in microelectronic applications , 2005, IBM J. Res. Dev..
[7] Katsuaki Suganuma,et al. Heat resistance of Sn-9Zn solder/Cu interface with or without coating , 2000 .
[8] T. Chiu,et al. Effect of thermal aging on board level drop reliability for Pb-free BGA packages , 2004, 2004 Proceedings. 54th Electronic Components and Technology Conference (IEEE Cat. No.04CH37546).
[9] Jenn-Ming Song,et al. Role of Ag in the formation of interfacial intermetallic phases in Sn-Zn soldering , 2005 .
[10] Jin Yu,et al. Controlling Ag3Sn plate formation in near-ternary-eutectic Sn-Ag-Cu solder by minor Zn alloying , 2004 .
[11] Min-Hsiung Hon,et al. Formation of intermetallic compounds at eutectic Sn–Zn–Al solder/Cu interface , 2001 .
[12] C. Kao,et al. Strong Zn concentration effect on the soldering reactions between Sn-based solders and Cu , 2006 .
[13] J. Onuki,et al. Influence of P Content in Electroless Plated Ni-P Alloy Film on Interfacial Structures and Strength between Sn-Zn Solder and Plated Au/Ni-P Alloy Film , 2002 .
[14] Jong-Kai Lin,et al. Mechanical tensile fracture behaviors of solid-state-annealed eutectic SnPb and lead-free solder flip chip bumps , 2003, 53rd Electronic Components and Technology Conference, 2003. Proceedings..
[15] Sinn-wen Chen,et al. Phase equilibria of the Sn–Zn–Cu ternary system , 2006 .
[16] Jin Yu,et al. Effect of Cu content on the mechanical reliability of Ni/Sn-3.5Ag system , 2007 .
[17] W. T. Chen,et al. Interfacial Microstructure Evolution Between Eutectic SnAgCu Solder and Al/Ni(V)/Cu Thin Films , 2002 .
[18] Sampath Purushothaman,et al. Interfacial reactions during soldering with lead-tin eutectic and lead (Pb)-free, tin-rich solders , 1996 .
[19] H. Chen,et al. New lead-free, Sn-Ag-Zn-Cu solder alloy with improved mechanical properties , 1994 .
[20] Tao-Chih Chang,et al. Growth and morphology of the intermetallic compounds formed at the Sn–9Zn–2.5Ag/Cu interface , 2005 .
[21] Y. L. Lin,et al. Effect of Cu concentration on the reactions between Sn-Ag-Cu solders and Ni , 2002 .
[22] Jin Yu,et al. Interfacial reactions of Sn-Ag-Cu solders modified by minor Zn alloying addition , 2006 .
[23] Y. Chan,et al. Effect of reaction time and P content on mechanical strength of the interface formed between eutectic Sn–Ag solder and Au/electroless Ni(P)/Cu bond pad , 2003 .
[24] Kazuaki Ano,et al. Kirkendall void formation in eutectic SnPb solder joints on bare Cu and its effect on joint reliability , 2005 .
[25] C. Law,et al. Microstructure evolution and shear strength of eutectic Sn-9Zn and Sn-0.7Cu lead-free BGA solder balls , 2004, Proceedings of the Sixth IEEE CPMT Conference on High Density Microsystem Design and Packaging and Component Failure Analysis (HDP '04).
[26] Hyuck-Mo Lee,et al. Effect of cooling rate on growth of the intermetallic compound and fracture mode of near-eutectic Sn-Ag-Cu/Cu pad: Before and after aging , 2004 .
[27] K. Tu,et al. Interfacialreactions and impactreliability of Sn–Zn solder joints on Cu or electroless Au/Ni(P) bond-pads , 2004 .
[28] G. Ramakrishna,et al. Kirkendall voids at Cu/solder interface and their effects on solder joint reliability , 2005, Proceedings Electronic Components and Technology, 2005. ECTC '05..