Optimal Selection Method of Test Points on Circuit Board Level

Test point selection is the basic problem of fault diagnosis systems. It is also one of the key links in designing the condition monitoring system. Aiming at the optimizing the test points on circuit board level, an optimal selection method is proposed. It is the method which combines the SVM algorithm and the feature selection method. The principle and process of the method are discussed in detail and in the fault diagnosis experiment of a circuit board, the effectiveness is verified finally.