Performance evaluation of dispatching rules for semiconductor testing operations

We evaluate the performance of several dispatching rules in a semiconductor testing environment and examine the effects of uncertainties in problem data and job arrival patterns. A series of simulation experiments shows that a single dispatching rule seldom performs well for several different performance measures simultaneously, non-homogenous job arrival patterns significantly affect several aspects of system performance while uncertainty in problem data does not, and the choice of dispatching rules for a given performance measure is robust to both arrival patterns and uncertainties.