DIRECT RESISTIVITY INTERPRETATION BY ACCUMULATION OF LAYERS

The asymptotic approximation of Pekeris is replaced by two new procedures referred to as the two-point method and the multilayer method, other steps in the direct interpretation remaining unmodified. The new methods are based on the assumption that there are at least one or two consecutive sample points of the kernel curve containing the information on a particular layer and containing no information on the deeper layers. In any step, the identified covering layers are accumulated and the interpretation progresses to the successive deeper layer. The multilayer method is oriented towards interpretation of data severly contaminated by noise. The elimination of noise with simultaneous averaging of layer parameters is performed in the domain of Dar Zarrouk parameters.