Normally off Al2O3–AlGaN/GaN MIS-HEMT With Transparent Gate Electrode for Gate Degradation Investigation
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Shu Yang | Xi Tang | Kevin J. Chen | Qimeng Jiang | Baikui Li | Q. Jiang | Shu Yang | Zhikai Tang | Baikui Li | Xi Tang | Yunyou Lu | Zhikai Tang | Yunyou Lu
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