Improved Characterization Methology for MOSFETs up to 220 GHz
暂无分享,去创建一个
[1] Lorene Samoska,et al. On-wafer testing of circuits through 220 GHz , 1999 .
[2] A.K. Fung,et al. On-Wafer Vector Network Analyzer Measurements in the 220-325 GHz Frequency Band , 2006, 2006 IEEE MTT-S International Microwave Symposium Digest.
[3] B. Jagannathan,et al. Record RF performance of 45-nm SOI CMOS Technology , 2007, 2007 IEEE International Electron Devices Meeting.
[4] J.A.M. Geelen,et al. An improved de-embedding technique for on-wafer high-frequency characterization , 1991, Proceedings of the 1991 Bipolar Circuits and Technology Meeting.
[5] Jyh-Chyurn Guo,et al. A new lossy substrate de-embedding method for sub-100 nm RF CMOS noise extraction and modeling , 2006, IEEE Transactions on Electron Devices.
[6] B. Cabon,et al. On-wafer high-frequency measurement improvements , 1994, Proceedings of 1994 IEEE International Conference on Microelectronic Test Structures.
[7] L.F. Tiemeijer,et al. Comparison of the "pad-open-short" and "open-short-load" deembedding techniques for accurate on-wafer RF characterization of high-quality passives , 2005, IEEE Transactions on Microwave Theory and Techniques.
[8] Paul Crozat,et al. Precise determination of open circuit capacitance of coplanar probes for on-wafer automatic network analyser measurements , 1991 .
[9] C. Kim,et al. A small-signal RF model and its parameter extraction for substrate effects in RF MOSFETs , 2001 .
[10] Keith Jones,et al. LRM and LRRM Calibrations with Automatic Determination of Load Inductance , 1990, 36th ARFTG Conference Digest.
[11] H. Cho,et al. A three-step method for the de-embedding of high-frequency S-parameter measurements , 1991 .
[12] J.A. Reynoso-Hernandez,et al. Analytical model and parameter extraction to account for the pad parasitics in RF-CMOS , 2005, IEEE Transactions on Electron Devices.
[13] T. Yoshimasu,et al. Linearity and low-noise performance of SOI MOSFETs for RF applications , 2002 .
[14] G. F. Engen,et al. Thru-Reflect-Line: An Improved Technique for Calibrating the Dual Six-Port Automatic Network Analyzer , 1979 .
[15] D. Gloria,et al. Efficient De-Embedding Technique for 110-GHz Deep-Channel-MOSFET Characterization , 2007, IEEE Microwave and Wireless Components Letters.
[16] D. Pasquet,et al. Small Signal Parameters Extraction for Silicon MOS Transistors , 2000, 2000 30th European Microwave Conference.
[17] D. Gloria,et al. Coupling on-wafer measurement errors and their impact on calibration and de-embedding up to 110 GHz for CMOS millimeter wave characterizations , 2007, 2007 IEEE International Conference on Microelectronic Test Structures.
[18] G. Dambrine,et al. A new method for determining the FET small-signal equivalent circuit , 1988 .
[19] Jean-Pierre Raskin,et al. Direct extraction of the series equivalent circuit parameters for the small-signal model of SOI MOSFETs , 1997 .