Probing local strain and composition in Ge nanowires by means of tip-enhanced Raman scattering.
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M. R. Wagner | J. Maultzsch | C. Thomsen | I. Berbezier | A. Ronda | A. Goñi | J. Reparaz | A. Hoffmann | N. Peica | M. Alonso | M. Garriga | R. Kirste | G. Callsen | I. C. Marcus