Model of image sensor signal correction in the computer microscopy system

The article is devoted to the analysis of the possibilities of improving the accuracy of the analysis of low-contrast images in the computer microscopy systems. The image distortion factors are considered in the system of computer microscopy with a camera based on a light-sensitive electronic matrix. The level of distortion of the image sensor signal in the computer microscopy system was estimated on the results of the experiment. The model of correction of distortions of the image sensor signal is offered. The application of the proposed model will provide an increase in the accuracy of automated analysis of microscopic images of low-contrast objects in the computer microscopy systems