论文信息 - Design and implementation of a low temperature near‐field scanning optical microscope

Design and implementation of a low temperature near‐field scanning optical microscope

The design and implementation of a low temperature (T≥1.5 K), near‐field scanning optical microscope are described herein. This microscope, which is based on the recently developed tapered fiber probe, is optimized for luminescence imaging and spectroscopy of mesoscopic semiconductor systems.

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