Generic jig for testing mixing performance of millimeter wave schottky diodes

In this paper a generic mixer test jig for millimeter wave Schottky diode testing is presented. The test jig enables relatively easy changing of the diode under test and thus testing and comparison of different mixer diodes in realistic operating conditions. The diode under test is mounted on a substrate and flexible RF and LO impedance matching is performed with integrated low-loss waveguide EH-tuner. The feasibility of the mixer test jig is tested with a commercial Schottky diode. The measured double side band (DSB) conversion loss is 4.6 dB and the DSB mixer noise temperature 650 K. The test jig is designed for the nominal RF frequency of 183 GHz.

[1]  Anders Emrich,et al.  Development of integrated submillimeter wave diodes for sources and detectors , 2010, The 5th European Microwave Integrated Circuits Conference.

[2]  P. Siegel.  THz Instruments for Space , 2007, IEEE Transactions on Antennas and Propagation.

[3]  Tero Kiuru,et al.  EH-impedance tuner with dielectric-based backshorts for millimetre wave diode testing , 2010, The 40th European Microwave Conference.

[4]  Tero Kiuru,et al.  Simple waveguide-to-suspended microstrip transition with low-pass filter , 2010, The 40th European Microwave Conference.

[5]  R.M. Weikle,et al.  Opening the terahertz window with integrated diode circuits , 2005, IEEE Journal of Solid-State Circuits.

[6]  J. Mallat,et al.  Characterisation of european millimetre-wave planar diodes , 2004, 34th European Microwave Conference, 2004..

[7]  R. Trambarulo,et al.  Conversion Loss and Noise Temperature of Mixers from Noise Measurements , 1983, 1983 IEEE MTT-S International Microwave Symposium Digest.