Correction of image drift and distortion in a scanning electron microscopy
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[1] Uwe Glatzel,et al. Measurement of the lattice misfit in the single crystal nickel based superalloys CMSX-4, SRR99 and SC16 by convergent beam electron diffraction , 1998 .
[2] C. G. Frase,et al. Model-Based Correction of Image Distortion in Scanning Electron Microscopy , 2010 .
[4] L. Kourkoutis,et al. Electron Microscopy of Biological Materials at the Nanometer Scale , 2012 .
[5] K. A. Padmanabhan,et al. Strain mapping in a deformation-twinned nanocrystalline Pd grain , 2010 .
[6] Xide Li,et al. Full field and microregion deformation measurement of thin films using electronic speckle pattern interferometry and array microindentation marker method , 2005 .
[7] M. Graef,et al. A method for measuring microstructural-scale strains using a scanning electron microscope: Applications to γ-titanium aluminides , 2003 .
[8] Anand Asundi,et al. Two-dimensional digital image correlation for in-plane displacement and strain measurement: a review , 2009 .
[10] Jean-Marie Tarascon,et al. In situ SEM study of the interfaces in plastic lithium cells , 1999 .
[11] Sounkalo Dembélé,et al. Fast image drift compensation in scanning electron microscope using image registration , 2013, 2013 IEEE International Conference on Automation Science and Engineering (CASE).
[12] E. Sudarshan,et al. Quantum theory of magnetic electron lenses based on the Dirac equation. , 1989 .
[13] J. Barnes,et al. Strain measurement at the nanoscale: Comparison between convergent beam electron diffraction, nano-beam electron diffraction, high resolution imaging and dark field electron holography. , 2013, Ultramicroscopy.
[14] R. Shimizu,et al. Third-order spherical aberration correction using multistage self-aligned quadrupole correction-lens systems. , 2010, Journal of electron microscopy.
[15] J. Gerber,et al. Evidence for electron orbital dependence of ion-beam induced attenuations of transient magnetic fields , 1991 .
[16] Lijun Xu,et al. Geometric distortion correction for sinusoidally scanned images , 2011 .
[17] Martin P. Seah,et al. Simplified drift characterization in scanning probe microscopes using a simple two-point method , 2009 .
[18] K. C. A. Smith,et al. An automatic focusing and astigmatism correction system for the SEM and CTEM , 1982 .
[19] Jean-Marie Tarascon,et al. In situ Scanning Electron Microscopy (SEM) observation of interfaces within plastic lithium batteries , 1998 .
[20] M. Sutton,et al. Scanning Electron Microscopy for Quantitative Small and Large Deformation Measurements Part II: Experimental Validation for Magnifications from 200 to 10,000 , 2007 .
[21] C. Auth,et al. 45nm High-k + metal gate strain-enhanced transistors , 2008, 2008 Symposium on VLSI Technology.
[22] T. Everhart,et al. Wide-band detector for micro-microampere low-energy electron currents , 1960 .
[23] Michael A. Sutton,et al. Scanning Electron Microscopy for Quantitative Small and Large Deformation Measurements Part I: SEM Imaging at Magnifications from 200 to 10,000 , 2007 .
[24] David Casasent,et al. Geometric correction of SEM images , 2000, SPIE Defense + Commercial Sensing.
[25] Masayuki Abe,et al. Drift-compensated data acquisition performed at room temperature with frequency modulation atomic force microscopy , 2007 .
[27] T R Bürglin. A two‐channel four‐dimensional image recording and viewing system with automatic drift correction , 2000, Journal of microscopy.
[28] Stéphane Roux,et al. Characterization of SEM speckle pattern marking and imaging distortion by digital image correlation , 2013 .
[29] J. Orteu,et al. Quantitative Stereovision in a Scanning Electron Microscope , 2011 .
[30] E. Zschech,et al. In situ SEM observation of electromigration phenomena in fully embedded copper interconnect structures , 2002 .
[31] F. Sachs,et al. Drift-free atomic force microscopy measurements of cell height and mechanical properties. , 2007, The Review of scientific instruments.