High Correlative Low Power Test Pattern Generator Using a Transition Monitoring Window

This paper presents a new low power BIST TPG scheme to make high correlative test pattern. It uses a transition monitoring window (TMW) that is comprised of a combination circuit block and a MUX. When random test patterns are generated by an LFSR, transitions of those patterns satisfy pseudo-random gaussian distribution. The proposed technique represses transitions of patterns using a k-value which is a standard that is obtained from the distribution of TMW to observe over transitive patterns causing high power dissipation in a scan chain. Experimental results show about 60% transition reduction without performance loss in ISCAS’89 benchmark circuits that have large number scan inputs.

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