论文信息 - SESEE: A soft error simulation and estimation engine

SESEE: A soft error simulation and estimation engine

Soft errors are radiation induced ionization events that upset the logic state o f the circuit. The sources o f these radiations are cosmic in origin; hence traditionally these upsets affected the space and aviation electronics. Due to technology scaling, these upsets are manifesting as errors in general off-the-shelf electronics circuits and hence a good simulation and error estimation tool is needed. In this work we present a new tool called Soft Error Simulation and Estimation Engine (SESEE). In this tool we simulate neutron induced soft error from basic principles, and use this information along with the information from circuit layout and spice-level simulation to calculate the circuit’s soft error rate (SER). Also as a case study the soft error rate o f a custom SRAM array is evaluated.

[1] J. Duderstadt,et al. Nuclear reactor analysis , 1976 .

[2] J. Ziegler,et al. Effect of Cosmic Rays on Computer Memories , 1979, Science.

[3] J. Ziegler,et al. stopping and range of ions in solids , 1985 .

[4] J. Ziegler. THE STOPPING AND RANGE OF IONS IN SOLIDS , 1988 .

[5] G. Srinivasan,et al. Accurate, predictive modeling of soft error rate due to cosmic rays and chip alpha radiation , 1994, Proceedings of 1994 IEEE International Reliability Physics Symposium.

[6] Y. Tosaka,et al. Cosmic ray neutron-induced soft errors in sub-half micron CMOS circuits , 1997, IEEE Electron Device Letters.

[7] J. F. Ziegler,et al. Terrestrial cosmic ray intensities , 1998, IBM J. Res. Dev..

[8] P. Hazucha,et al. Impact of CMOS technology scaling on the atmospheric neutron soft error rate , 2000 .

[9] R. Baumann. The impact of technology scaling on soft error rate performance and limits to the efficacy of error correction , 2002, Digest. International Electron Devices Meeting,.