Thermal test- and field cycling induced degradation and its FE-based prediction for different SAC solders
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B. Michel | R. Dudek | M. Roellig | W. Faust | B. Michel | R. Dudek | M. Roellig | W. Faust | R. Ratchev | H. Albrecht | H.-J. Albrecht | R. Ratchev
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