论文信息 - Atomic force microscope integrated with a scanning electron microscope for tip fabrication

Atomic force microscope integrated with a scanning electron microscope for tip fabrication

In a new combined atomic force microscope/scanning electron microscope, we have been able to fabricate and test electron‐beam‐deposited tips (e‐beam tips). With this instrument it was possible to test newly grown e‐beam tips within a few minutes of their formation, without ever breaking vacuum. Typical results on oxide‐sharpened conventional tips showed that the radius of curvature could be reduced by a factor of 2.5 with the e‐beam tips.

H. Hansma | P. Hansma | D. Walters | B. Drake | D. Hampton

[1] C. Williams. Scanning Probe Microscopies II , 1993 .

[2] Z. Shao,et al. An optical detection low temperature atomic force microscope at ambient pressure for biological research , 1993 .

[3] H. Hansma,et al. Atomic force microscopy of DNA in aqueous solutions. , 1993, Nucleic acids research.

[4] C. Bustamante,et al. Substrate preparation for reliable imaging of DNA molecules with the scanning force microscope. , 1992, Ultramicroscopy.

[5] C. Siegerist,et al. Reproducible Imaging and Dissection of Plasmid DNA Under Liquid with the Atomic Force Microscope , 1992, Science.

[6] C. Bustamante,et al. Circular DNA molecules imaged in air by scanning force microscopy. , 1992, Biochemistry.

[7] David Keller,et al. Imaging steep, high structures by scanning force microscopy with electron beam deposited tips , 1992 .

[8] H. Murakami,et al. New scanning tunneling microscopy tip for measuring surface topography , 1990 .