Advances in the crystal growth of semi-insulating CdZnTe for radiation detector applications

The growth of large-volume semi-insulating CdZnTe single crystals with improved structural perfection has been demonstrated by the electrodynamic gradient (EDG) technique and active control of the Cd partial pressure in the ampoule. The EDG furnace nearly completely eliminates the uncontrolled radiative heat transport commonly encountered in traditional Bridgman systems where the charge and furnace move relative to each other. Since the new furnace utilizes electronically controlled high-precision gradient translation, it achieves superior thermal stability throughout the growth. The control of the Cd partial pressure allowed the solidification and cool-down of the ingots close to the stoichiometric composition. As a result, the formation and incorporation of large-size (/spl ges/1 /spl mu/m diameter) Te inclusions was avoided during crystallization and ingots with high structural perfection were achieved. Adequate electrical compensation has been achieved in most of the crystal growth experiments yielding CdZnTe crystals with bulk electrical resistivity in the 10/sup 9/-10/sup 10/ /spl Omega//spl middot/cm range and electron mobility-lifetime product as high as /spl mu//spl tau//sub e/=1.2/spl times/10/sup -3/ cm/sup 2//V. The materials exhibit good spectral performance in the parallel plate detector configuration.

[1]  Tuviah E. Schlesinger,et al.  Role of uniformity and geometry in IMARAD-type gamma-ray spectrometers , 1999, Optics & Photonics.

[2]  J. F. Schetzina,et al.  Properties of CdZnTe crystals grown by a high pressure Bridgman method , 1992 .

[3]  Kelvin G. Lynn,et al.  Semi-insulating CdZnTe with improved structural perfection for radiation detector applications , 2001, SPIE Optics + Photonics.

[4]  G. Neumark,et al.  Effect of deep levels on semiconductor carrier concentrations in the case of , 1982 .

[5]  Heinrich F. Arlinghaus,et al.  Reduction of CdZnTe substrate defects and relation to epitaxial HgCdTe quality , 1996 .

[6]  P. Rudolph,et al.  Distribution and genesis of inclusions in CdTe and (Cd,Zn)Te single crystals grown by the Bridgman method and by the travelling heater method , 1995 .

[7]  K. Hecht Zum Mechanismus des lichtelektrischen Primärstromes in isolierenden Kristallen , 1932 .

[8]  J. F. Butler,et al.  CdTe low level gamma detectors based on a new crystal growth method , 1988 .

[9]  S. Takeuchi,et al.  Observation of dislocations in cadmium telluride by cathodoluminescence microscopy , 1979 .

[10]  K. Benz,et al.  Vapor pressure scanning of non-stoichiometry in CdZnTe , 1993 .

[11]  C. Johnson,et al.  Recipe to minimize Te precipitation in CdTe and (Cd,Zn)Te crystals , 1992 .

[12]  Beatrice Fraboni,et al.  Deep energy levels in CdTe and CdZnTe , 1998 .

[13]  Csaba Szeles,et al.  Current Issues of High-Pressure Bridgman Growth of Semi-Insulating CdZnTe , 1997 .

[14]  Gomez W. Wright,et al.  Characterization of multi-element CZT arrays , 2000, SPIE Optics + Photonics.

[15]  Kelvin G. Lynn,et al.  Electrical compensation in CdTe and CdZnTe by intrinsic defects , 2000, SPIE Optics + Photonics.

[16]  P. Rudolph,et al.  Basic problems of vertical Bridgman growth of CdTe , 1993 .