Waveform based MOSFET dynamic large-signal parameter estimation

A multifunctional time domain modelling large-signal data acquisition system is used to acquire and to extract the intrinsic parameters of a MOSFET using only one waveform measurement. The measurement is performed at the operating frequency of 2.4 GHz, selected for the Bluetooth wireless networking protocol. Details of the non-linear measurement system are provided and its application in the new extraction procedure described. Validation of the extracted parameters is referenced to traditional S-parameter extraction methods and measured large-signal measurements.