论文信息 - Xpert MTB/RIF Assay as a Substitute for Smear Microscopy in an Intermediate‐Burden Setting - 字舞流文

Xpert MTB/RIF Assay as a Substitute for Smear Microscopy in an Intermediate‐Burden Setting

H. Choi | S. Suh | E. Won | Jong-Hee Shin | S. Kim | M. Shin | Seung-Jung Kee | Yong-Soo Kwon | S. Chun | Hyun-Seung Lee | Ju-Hyeon Shin | Jun Hyung Lee | J. Shin | Jong‐Hee Shin