Multispectrum fitting measurements of line parameters for 5-μm cold bands of acetylene
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J.-Y. Mandin | V. Dana | D. Jacquemart | D. Jacquemart | V. Dana | J. Mandin | L. Régalia-Jarlot | X. Thomas | P. Von der Heyden | X. Thomas | P. V. D. Heyden | L. Régalia-Jarlot
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