Dynamic friction force measurement with the scanning force microscope

Scanning Force Microscopes excert lateral forces on the sample during measurement. The recording of the magnitude of these forces as a function of position gives friction maps. The possible scanning speeds of SFM, however, are far below the velocities of practical devices. The dynamic friction force measurement provides a solution to this problem. The sample is modulated laterally at frequencies up to several kilohertz and with amplitudes in the nanometer range. It is shown that the interaction with the sample is not only determined by friction, but also by the viscoelastic response of the sample. The combination of dynamic friction measurement with the intermittent contact measurement mode, the PulsedForceMode, gives full access to the relevant sample parameters: topography, lateral ‘friction’ forces, adhesion, sample stiffness and relaxations times.

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