Retrieval of single scattering albedo of winter wheat in North China Plain based on AMSR-E data

In this study, a parameterized first-order radiative transfer (RT) model for short vegetation layer is employed to retrieve the single scattering albedo of winter wheat by combining passive microwave AMSR-E data with optical MODIS data. The microwave vegetation indices (MVIs) with two adjacent frequencies of AMSR-E at H/V polarization derived from the parameterized model are used to cancel out the ground surface emission signals. Then a simulating database based on field measured parameters is established to figure out the relationship of the optical thickness, single scattering albedo at C and X band, respectively. Finally the characteristics of retrieved single scattering albedo are analyzed and the daily NDVI was utilized for evaluating the retrieved results.