Structural localization of trace amounts of impurity ions in Langmuir-Blodgett films by the X-ray standing wave method
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W. Haase | R. Gainutdinov | N. Novikova | Y. Galyametdinov | A. Tolstikhina | S. Zheludeva | N. Stepina | A. I. Erko | A. Erko | S. I. Zheludeva