Dispersion properties of submicron-thin CdS crystals

The data are summarized, obtained by interference measurements at 4.2 K, on the dispersion of the refractive index n(λ) of submicron-thin CdS single crystals. The series of the dispersion curves, n(λ), measured for crystals of different thickness, is approximated by theoretical dependences allowing for spatial dispersion. These data present clear evidence that the refractive index depends on the thickness of crystals provided their dimensions are comparable with the wavelength of light or smaller than the latter. [Russian Text Ignored].