A self-calibration procedure for a sinusoidal fringe profilometer

The paper describes a calibration procedure for a structured-light sinusoidal-fringe profilometer which requires the acquisition of images of a plane in one or more unknown poses when it is illuminated by sinusoidal fringe patterns projected by an illuminator. The procedure does not require specific target but only a planar surface which can be freely moved or rotated around a vertical axis.

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